Solid State Analytics - Röntgen

We offer you many possibilities for X-ray investigations

The main working fields are:

  • Guinier, Debye-Scherrer and Gandolfi investigations
    (Filmdata for phase identification and calculation of lattice parameters)
  • Measurements in reflection mode on powder samples
    (Phase overview and identification, lattice parameter)
  • Measurements in transmission mode on powder samples
    (Phase identification, composition or structure refinement using the Rietveld method)
  • Heating measurements in reflection mode on powder samples
    (Analysis of phase transitions up to 1150 K)
  • Precession photographs of single crystals
    (Quality and symmetry check)
  • Diffractometer data of single crystals
    (Structure refinement and solution, low tempwerature measurement down to 110K)

For further investigations please contact us