We offer you many possibilities for X-ray investigations
The main working fields are:
- Guinier, Debye-Scherrer and Gandolfi investigations
(Filmdata for phase identification and calculation of lattice parameters) - Measurements in reflection mode on powder samples
(Phase overview and identification, lattice parameter) - Measurements in transmission mode on powder samples
(Phase identification, composition or structure refinement using the Rietveld method) - Heating measurements in reflection mode on powder samples
(Analysis of phase transitions up to 1150 K) - Precession photographs of single crystals
(Quality and symmetry check) - Diffractometer data of single crystals
(Structure refinement and solution, low tempwerature measurement down to 110K)
For further investigations please contact us